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| Parameter | Instrument |
| Surface Figure Relected Wavefront Distortion Transmitted Wavefront Distortion |
18" Zygo Mark IV xp 12" Zygo Mark II 6" Zygo Mark IV xp 4" Zygo Mark II |
| Surface Roughness | Chapman Profiler MP2000 |
| Spectral Characteristics | Hitachi U-4001 Spectrophotometer Perkin Elmer 1600 FTIR |
| Environmental | Salt/Fog Chamber Temperature/Humidity Chamber Avex Shock Tester |
| Crystal Orientation | Double Crystal X-Ray Spectrometer Back Reflection Laue |
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As the manufacturer, responsibility for testing products to specification lies with us. We rely on sophisticated instrumentation for in-process and final inspection.
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| New Technology | New
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